"Biometric Identification: Theory, Algorithms, and Applications", Coordinator and Lecturer James L. Wayman at UCLA, July 28-30 - May 03, 2008

Biometric identification technologies (the automatic recognition of individuals based on physical and/or behavioral characteristics) date back over 50 years to the earliest digital computers. Over the last two decades, biometric identification devices have become faster, cheaper, and more reliable, allowing for a variety of applications. This course looks at the history, theory, algorithms, applications, and standards of biometric recognition, including voice, iris, face, hand, and fingerprint identification. Test protocols, system design, and error rate prediction are discussed, along with the implications of the technology for personal privacy.

UCLA Extension has presented this highly successful short course since 2000.

Course Materials
The text, Biometric Systems, J.L. Wayman, et al, editors (Springer-Verlag, 2005), and lecture notes are distributed on the first day of the course. These notes are for participants only and are not for sale.

Coordinator and Lecturer
James L. Wayman, PhD, Office of Research and Graduate Studies, San Jose State University, San Jose, California. The Center served as the U.S. National Biometric Test Center from 1997-2000, with Dr. Wayman as the director, reporting to the Clinton administration through the Security Policy Board. Prior to his current position, he was a full-time researcher for the Department of Defense in the areas of technical security and biometrics. He also invented and developed a biometric system based on the acoustic resonance of the human head. Dr. Wayman holds four patents in speech processing; is co-editor of Biometric Systems with Jain, Maltoni, and Maio (Springer-Verlag, 2005); and is the author of dozens of articles in books, peer-reviewed technical journals, and conference proceedings on biometrics, speech compression, image processing, and network control. He is a "Principal U.K. Expert" and Working Group 1 Head for Delegation for the British Standards Institute national body to the international standards committee SC37 on biometrics; Fellow of the UK IET; contractor to the U.S. DoD and FBI; Honorary Professor of Electronics, University of Kent; and member of the National Research Council Committee "Whither Biometrics?", the NRC Panel for Information Technology, and the former NRC committee on "Authentication Technologies and their Privacy Implications."

UCLA Faculty Representative
Abeer Alwan, PhD, Professor, Department of Electrical Engineering, Henry Samueli School of Engineering and Applied Science

Daily Schedule

Monday
Introduction

A very short history of biometrics
Definitions
Core concepts
Taxonomy of applications
System description
Performance metrics
Successful and unsuccessful applications
Mathematical Underpinnings
Vector spaces
Distance measures and distributions
Genuine, imposter, and intertemplate distributions
Correlation and covariance matrices

Tuesday
Mathematical Underpinnings (continued)

Eigen-Systems and principal component analysis
Sampling theory
Generalized Fourier Transform
One- and two-dimensional transforms
One- and two-dimensional filtering
Neural nets and support vector machines
Probability fundamentals
Derivation of binomial distribution
Doddington's Rule of 30
Rule of 3
The limitations of the binomial distribution
Doddington's Zoo
Technologies
Voice
—Segmentation
—Mel-scale cepstrum
—HMM
—GMM

Wednesday
Technologies (continued)

Face
—Segmentation
—Decomposition methods (eigenface, LFA, ICA)
—Support Vector Machines
—Elastic Bunch Grapes
—Implicit 3-D models
—3-D methods
Fingerprint methods
—Optical
—Transform
—Correlation
—Minutiae extraction
—Collection, transmission, and storage standards
Iris
—Daugman's 1994 patent
—Segmentation
—Feature extraction
—Comparison
Hand geometry
—Hardware description
—Raw data collection

Testing Results and Protocols

ISO/IEC 19795-1 document
NIST test programs: SRE, Proprietary Fp Template Testing, FRVT, MBGC, and other NIST results

Large-Scale System Performance

Case studies: international civil systems
—Philippine Social Security System ID
—Australian SmartGate

Binning and penetration rates

Vulnerability Assessment

UK vulnerability assessment documents
European activities and testing
Vander Putte, Matsumoto, Murley, and C'T
Common criteria

For more information call the Short Course Program Office at (310) 825-3344; fax (310) 206-2815.


Dates July 28-30 (Monday through Wednesday)

Time 8 am-5 pm (subject to adjustment after the first class meeting)

Location Room G-33 West, UCLA Extension Building, 10995 Le Conte Avenue (adjacent to the UCLA campus), Los Angeles, California

Reg# U2314U
Click on this Reg# to enroll. Requires payment at time of enrollment; parking not included. To make a tentative reservation, see "Enrollment" under Additional Information in the left-hand navigational bar.

Course No. Engineering 867.143

Units 1.8 CEU (18 hours of instruction)

Fee $1,795, includes course materials
$100 nonrefundable; no refund after July 17, 2008; however, course fee (less $100) may be applied toward another short course enrollment.

Read more about Biometric Industry Events and Conferences.

Read more about Biometric Industry Useful Links.

Read more about Biometric Technologies:

Fingerprint, Iris Recognition, Hand & Finger, Facial Recognition, Voice/Speaker, Consultants, Smart Cards/Multimodal, Signature/Keystroke, 2D Barcodes, Sensors, Middleware/Software, Vascular Pattern Recognition

Read more about Biometric Applications:

Physical Access Control, Logical Access Control, Justice/Law Enforcement, Time and Attendance, Border Control/Airports, HIPAA, Financial/Transactional, Integrators/Resellers, Safes, Door Locks, Other

 

back